DocumentCode
474260
Title
A submillimeter wave material scanner - applications and prospects
Author
Krebs, Christian ; Schlauch, Eva ; Schneider, Stefan ; Nüßler, Dirk
Author_Institution
Res. Inst. for High Freq. Phys. & Radar Tech., Wachtberg
fYear
2007
fDate
2-9 Sept. 2007
Firstpage
989
Lastpage
990
Abstract
The aim of this project is the development of a measurement system to analyse different materials. Scalar measurements with a real aperture have been conducted at frequencies between 75 GHz and 260 GHz. Different types of objects have been investigated to show the possibilities and limitations of the system.
Keywords
reflectivity; submillimetre wave imaging; submillimetre wave measurement; frequency 75 GHz to 260 GHz; reflection geometry; scalar measurements; submillimeter wave material scanner; submillimetre wave imaging; Antenna measurements; Dielectrics; Frequency conversion; Frequency measurement; Geometry; Laser radar; Packaging; Pollution measurement; Reflection; Submillimeter wave devices; material scanner; submillimeter wave imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location
Cardiff
Print_ISBN
978-1-4244-1438-3
Type
conf
DOI
10.1109/ICIMW.2007.4516822
Filename
4516822
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