Title :
A submillimeter wave material scanner - applications and prospects
Author :
Krebs, Christian ; Schlauch, Eva ; Schneider, Stefan ; Nüßler, Dirk
Author_Institution :
Res. Inst. for High Freq. Phys. & Radar Tech., Wachtberg
Abstract :
The aim of this project is the development of a measurement system to analyse different materials. Scalar measurements with a real aperture have been conducted at frequencies between 75 GHz and 260 GHz. Different types of objects have been investigated to show the possibilities and limitations of the system.
Keywords :
reflectivity; submillimetre wave imaging; submillimetre wave measurement; frequency 75 GHz to 260 GHz; reflection geometry; scalar measurements; submillimeter wave material scanner; submillimetre wave imaging; Antenna measurements; Dielectrics; Frequency conversion; Frequency measurement; Geometry; Laser radar; Packaging; Pollution measurement; Reflection; Submillimeter wave devices; material scanner; submillimeter wave imaging;
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
DOI :
10.1109/ICIMW.2007.4516822
