Title :
Single Device Logic using 3D Gating of Screen Grid Field Effect Transistors
Author :
Shadrokh, Y. ; Fobelets, K. ; Velazquez-Perez, J.E.
Author_Institution :
Electr. Eng. Dept., Imperial Coll. London, London
fDate :
Oct. 15 2007-Sept. 17 2007
Abstract :
The screen grid field effect transistor (SGrFET) is an oxide-gated FET with a novel 3D gating configuration perpendicular to the current flow in the channel. The multiple gate character of the SGrFET lends itself perfectly to compact logic applications with a reduced number of devices per gate. In this report TCAD results of both DC and transient performance of double-gate row SGrFET logic are presented. The analysis of both the complementary and the all-n-type SGrFET inverter logic gives ps rise times and large noise margins up to 400 mV for IV supply. NAND, NOR and XOR logics can be obtained using only two n-type SGrFETs.
Keywords :
field effect transistors; logic gates; technology CAD (electronics); 3D gating; NAND logics; NOR logics; SGrFET inverter logic; TCAD; XOR logics; double-gate row SGrFET logic; multiple gate character; oxide-gated FET; screen grid field effect transistors; single device logic; CMOS logic circuits; Contacts; Doping; Educational institutions; FETs; FinFETs; Fingers; Gold; Logic devices; Threshold voltage; FETs; semiconductor device logic; semiconductor device modeling; transient analysis;
Conference_Titel :
Semiconductor Conference, 2007. CAS 2007. International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-0847-4
DOI :
10.1109/SMICND.2007.4519644