Title : 
From Models to Code: Automatic Development Process for Embedded Control System
         
        
            Author : 
Shu, Zhaogang ; Li, Di ; Hu, Yueming ; Ye, Feng ; Xiao, Suhua ; Wan, Jiafu
         
        
            Author_Institution : 
South China Univ. of Technol., Guangzhou
         
        
        
        
        
        
            Abstract : 
Current development method for embedded control system is mainly based on manual programming, so it is very time-consuming and is difficult to guarantee system performance. The paper presents a modeling language for embedded control system development, called ECSML, and a corresponding automatic code generation framework. ECSML satisfies the modeling requirements, including functionality and real-time performance, for control system. Based on ECSML, a graphical modeling environment has been created. The code generation framework takes advantage of the reusability of component-based development (CBD) method. A well-defined code structure, in which function code and non-function code are separated completely, makes it possible to generate all system code from models. This development method can promote development efficiency, reduce development cost and shorten the time to market of embedded control products.
         
        
            Keywords : 
control engineering computing; embedded systems; object-oriented programming; program compilers; ECSML; automatic code generation; automatic development process; component-based development; embedded control system; graphical modeling environment; manual programming; Application software; Automatic control; Automatic generation control; Control system synthesis; Embedded software; Embedded system; Mathematical model; Process control; Real time systems; Software systems; code generation; embedded control system; model interpreter; modeling;
         
        
        
        
            Conference_Titel : 
Networking, Sensing and Control, 2008. ICNSC 2008. IEEE International Conference on
         
        
            Conference_Location : 
Sanya
         
        
            Print_ISBN : 
978-1-4244-1685-1
         
        
            Electronic_ISBN : 
978-1-4244-1686-8
         
        
        
            DOI : 
10.1109/ICNSC.2008.4525299