DocumentCode :
47437
Title :
A New ANN-Based Modeling Approach for Rapid EMI/EMC Analysis of PCB and Shielding Enclosures
Author :
Devabhaktuni, Vijay ; Bunting, Charles F. ; Green, Dale ; Kvale, D. ; Mareddy, L. ; Rajamani, Venkiteswaran
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Toledo, Toledo, OH, USA
Volume :
55
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
385
Lastpage :
394
Abstract :
This paper introduces a new artificial neural networks (ANNs)-based reverse-modeling approach for efficient electromagnetic compatibility (EMC) analysis of printed circuit boards (PCBs) and shielding enclosures. The proposed approach improves the accuracy of conventional or standard neural models by reversing the input-output variables in a systematic manner, while keeping the model structures simple relative to complex knowledge-based ANNs (e.g., KBNNs). The approach facilitates accurate and fast neural network modeling of realistic EMC scenarios where training data are expensive and sparse. To establish accuracy, efficiency, and feasibility of the proposed reverse-modeling approach, PCB structures such as perforated surface-mount shields and partially shielded PCB traces are treated as proof-of-concept examples. Although the modeling examples presented in the paper are based on training data from EM simulations, the approach is generic and hence valid for EMC modeling based on the measurement data. The approach is particularly useful in the electronic manufacturing industry where PCB layouts are frequently reused with minor modifications to the existing time-tested designs.
Keywords :
computational electromagnetics; electromagnetic compatibility; electromagnetic shielding; electronic engineering computing; neural nets; printed circuit layout; printed circuits; surface mount technology; EM simulation; EMI-EMC analysis; KBNN; PCB; artificial neural network; electromagnetic compatibility; electronic manufacturing industry; fast neural network modeling; knowledge-based ANN; printed circuit board; reverse-modeling approach; shielding enclosures; Accuracy; Apertures; Artificial neural networks; Computational modeling; Data models; Electromagnetic compatibility; Training data; Artificial neural networks; computational electromagnetics; electromagnetic radiation; electromagnetic shielding; modeling;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2012.2214223
Filename :
6313901
Link To Document :
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