• DocumentCode
    474447
  • Title

    Speedpath prediction based on learning from a small set of examples

  • Author

    Bastani, Pouria ; Killpack, Kip ; Wang, Li.-C. ; Chiprout, Eli

  • Author_Institution
    California Univ., Santa Barbara, CA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    217
  • Lastpage
    222
  • Abstract
    In high performance designs, speed-limiting logic paths (speedpaths) impact the power/performance trade-off that is becoming critical in our low power regimes. Timing tools attempt to model and predict the delay of all the paths on a chip, which may be in the millions. These delay predictions often have a significant error and when silicon is measured there is a large variation of path delays as compared to the prediction of the tools. This variation may be caused by process, environmental or other effects that are often unpredictable. It is therefore desirable to use early silicon data to better predict and model potential speedpaths for subsequent silicon steppings. In this paper, we present a novel machine learning-based approach that uses a small number of identified speedpaths to predict a larger set of potential speedpaths, thus significantly enhancing the traditional timing prediction flows post-silicon. We demonstrate the feasibility of this approach and summarize our findings based on the analysis of silicon speedpaths from a 65 nm P4 microprocessor.
  • Keywords
    learning (artificial intelligence); logic design; microcomputers; P4 microprocessor; high performance designs; learning; size 65 nm; small set of examples; speed limiting logic paths; speedpath prediction; Algorithm design and analysis; Delay; Design optimization; Logic design; Performance analysis; Predictive models; Semiconductor device measurement; Silicon; Testing; Timing; Learning; Speedpath; Timing analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555811