DocumentCode :
474455
Title :
Assertion-based verification of a 32 thread SPARC™ CMT microprocessor
Author :
Turumella, Babu ; Sharma, Mukesh
Author_Institution :
Sun Microsyst. Inc., Santa Clara, CA
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
256
Lastpage :
261
Abstract :
Exhaustive property checking, design defect isolation and functional coverage measurement are some of the key challenges of design verification. This paper describes how an assertion based approach successfully addressed these challenges for the verification of an enterprise class chip-multi-threaded (CMT) SPARC microprocessor. Methodology and experiences are discussed and recommendations are made on how to incorporate this into the design verification process. Experience with using assertion checks for formal verification as well as simulation based verification is presented, which is part of over 100 person year design verification effort.
Keywords :
CAD; design aids; formal verification; microprocessor chips; multi-threading; assertion-based verification; chip-multi-threaded SPARC microprocessor; design defect isolation; design verification process; exhaustive property checking; formal verification; functional coverage measurement; simulation based verification; Debugging; Formal verification; Hardware design languages; Microprocessors; Parallel processing; Permission; Process design; Semiconductor device measurement; Sun; Yarn; Assertions; Coverage; Multi-threading; Simulation; Verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
978-1-60558-115-6
Type :
conf
Filename :
4555819
Link To Document :
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