• DocumentCode
    474455
  • Title

    Assertion-based verification of a 32 thread SPARC™ CMT microprocessor

  • Author

    Turumella, Babu ; Sharma, Mukesh

  • Author_Institution
    Sun Microsyst. Inc., Santa Clara, CA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    256
  • Lastpage
    261
  • Abstract
    Exhaustive property checking, design defect isolation and functional coverage measurement are some of the key challenges of design verification. This paper describes how an assertion based approach successfully addressed these challenges for the verification of an enterprise class chip-multi-threaded (CMT) SPARC microprocessor. Methodology and experiences are discussed and recommendations are made on how to incorporate this into the design verification process. Experience with using assertion checks for formal verification as well as simulation based verification is presented, which is part of over 100 person year design verification effort.
  • Keywords
    CAD; design aids; formal verification; microprocessor chips; multi-threading; assertion-based verification; chip-multi-threaded SPARC microprocessor; design defect isolation; design verification process; exhaustive property checking; formal verification; functional coverage measurement; simulation based verification; Debugging; Formal verification; Hardware design languages; Microprocessors; Parallel processing; Permission; Process design; Semiconductor device measurement; Sun; Yarn; Assertions; Coverage; Multi-threading; Simulation; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555819