Title :
Early formal verification of conditional coverage points to identify intrinsically hard-to-verify logic
Author :
Ho, C. Richard ; Theobald, Michael ; Deneroff, Martin M. ; Dror, Ron O. ; Gagliardo, Joseph ; Shaw, David E.
Author_Institution :
D.E. Shaw Res., New York, NY
Abstract :
Design verification of complex digital circuits typically starts only after the register-transfer level (RTL) description is complete. This frequently makes verification more difficult than necessary because logic that is intrinsically hard to verify, such as memories, counters and deep first-in, first-out (FIFO) structures, becomes immutable in the design. This paper proposes a new approach that exploits formal verification of conditional coverage points with the goal of early identification of hard-to-verify logic. We use the difficulty of formal verification problems as an early estimator of the verification complexity of a design. While traditional verification methods consider conditional coverage only in the design verification phase, we describe an approach that uses conditional coverage at a much earlier stage-the design phase, during which changes to the RTL code are still possible. The method is illustrated using real examples from the verification of an ASIC designed for a specialized supercomputer.
Keywords :
application specific integrated circuits; formal verification; integrated circuit design; integrated logic circuits; logic design; logic testing; ASIC design; RTL code; complex digital circuit design verification; conditional coverage points; early formal verification; intrinsic hard-to-verify logic identification; register-transfer level description; Analytical models; Application specific integrated circuits; Circuit simulation; Computational modeling; Counting circuits; Digital circuits; Discrete event simulation; Formal verification; Logic circuits; Logic design; Formal verification; code coverage; conditional coverage; coverage hole; inconclusive results; verifiability;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6