Title :
Bounded-lifetime integrated circuits
Author :
Gupta, Puneet ; Kahng, Andrew B.
Author_Institution :
Dept. of ECE, California Univ., La Jolla, CA
Abstract :
Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.
Keywords :
integrated circuit reliability; nanotechnology; bounded lifetimes; integrated circuits; nanometer reliability; Application specific integrated circuits; Capacitors; Computer applications; Counting circuits; Electromigration; Hardware; Integrated circuit modeling; Integrated circuit reliability; Manufacturing; Tunable circuits and devices; Bounded lifetime; integrated circuits; physical IP;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6
