Title :
Input vector control for post-silicon leakage current minimization in the presence of manufacturing variability
Author :
Alkabani, Yousra ; Massey, Tammara ; Koushanfar, Farinaz ; Potkonjak, Miodrag
Author_Institution :
Rice Univ., Houston, TX
Abstract :
We present the first approach for post-silicon leakage power reduction through input vector control (IVC) that takes into account the impact of the manufacturing variability (MV). Because of the MV, the integrated circuits (ICs) implementing one design require different input vectors to achieve their lowest leakage states. We address two major challenges. The first is the extraction of the gate- level characteristics of an IC by measuring only the overall leakage power for different inputs. The second problem is the rapid generation of input vectors that result in a low leakage for a large number of unique ICs that implement a given design, but are different in the post-manufacturing phase. Experimental results on a large set of benchmark instances demonstrate the efficiency of the proposed methods. For example, the leakage power consumption could be reduced in average by more than 10.4%, when compared to the previously published IVC techniques that did not consider MV.
Keywords :
integrated circuit design; integrated circuit manufacture; leakage currents; low-power electronics; input vector control; integrated circuits design; manufacturing variability; post-silicon leakage current minimization; power reduction; Algorithm design and analysis; Computer aided manufacturing; Computer science; Integrated circuit synthesis; Inverters; Leakage current; Minimization; Permission; Power engineering computing; Power measurement; Input Vector Control; Low Power; Manufacturing Variability;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6