DocumentCode
474539
Title
Efficient Monte Carlo based incremental statistical timing analysis
Author
Veetil, Vineeth ; Sylvester, Dennis ; Blaauw, David
Author_Institution
EECS Dept., Univ. of Michigan, Ann Arbor, MI
fYear
2008
fDate
8-13 June 2008
Firstpage
676
Lastpage
681
Abstract
Modeling and accuracy difficulties exist with traditional SSTA analysis and optimization methods. In this paper we describe methods to improve the efficiency of Monte Carlo-based statistical static timing analysis. We propose a Stratification + Hybrid Quasi Monte Carlo (SH- QMC) approach to reduce the number of samples required for Monte Carlo based SSTA. Our simulations on benchmark circuits up to 90 K gates show that the proposed method requires 23.8X fewer samples on average to achieve comparable accuracy in timing estimation as a random sampling approach. Results on benchmark circuits also show that when SH-QMC is performed with multiple parallel threads on a quad core processor, the approach is faster than traditional SSTA with comparable accuracy. SH-QMC scales better than traditional SSTA with circuit size. We also propose an incremental approach to recompute a percentile delay metric after ECO. The results show that on average only 1.4% and 0.7% of original samples need to be evaluated for exact recomputation of the 95 percentile and 99 percentile delays, after sample size reduction using SH-QMC.
Keywords
CMOS integrated circuits; Monte Carlo methods; benchmark testing; integrated circuit modelling; statistical analysis; technology CAD (electronics); Monte Carlo simulations; benchmark circuits; computer-aided design tools; incremental statistical timing analysis; multiple parallel threads; nanometer-scale CMOS; percentile delay metric; variance reduction; Analysis of variance; Circuits; Delay estimation; Design automation; Monte Carlo methods; Optimization methods; Runtime; Sampling methods; Timing; Yield estimation; Monte Carlo; Statistical timing; Variance reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location
Anaheim, CA
ISSN
0738-100X
Print_ISBN
978-1-60558-115-6
Type
conf
Filename
4555905
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