DocumentCode :
474554
Title :
Leveraging sequential equivalence checking to enable system-level to RTL flows
Author :
Urard, Pascal ; Maalej, Asma ; Guizzetti, Roberto ; Chawla, Nitin ; Krishnaswamy, Venkatram
Author_Institution :
ST Microelectron., Geneva
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
816
Lastpage :
821
Abstract :
It has long been the practice to create models in C or C+ + for architectural studies, software prototyping and RTL verification in the design of Systems-on-Chip (SoC). It is often the case that by the end of a design project, multiple C models exist for different uses. Since a lot of time is invested in ensuring the functional correctness of these models via their use in system-level simulations, they often become "golden " functional reference models. Design teams are moving towards leveraging these system-level models to reduce the time needed for design and verification of RTL On the design side, the use of high-level synthesis tools to synthesize RTL from C/C+ + models is gaining ground for certain classes of blocks within a design. On the verification front, temporal differences at interfaces and in internal states between system-level models and RTL prevent the use of combinational equivalence checkers. This paper focuses on the use of sequential equivalence checking to verify functional equivalence between system-level models and RTL and describes the challenges and vale of using it in system-level to RTL flows.
Keywords :
C language; C++ language; high level synthesis; software prototyping; system-on-chip; C model; C++ model; RTL flow; SoC design; high-level synthesis tool; register transfer level; sequential equivalence checking; software prototyping; system-level model; systems-on-chip; Automatic control; Computer bugs; Delay; Formal verification; High level synthesis; Intelligent vehicles; Processor scheduling; Software prototyping; Testing; Throughput; High-level synthesis; RTL models; System-level models; equivalence checking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
978-1-60558-115-6
Type :
conf
Filename :
4555932
Link To Document :
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