DocumentCode
474569
Title
DFM in practice: Hit or hype?
Author
Rey, Juan C. ; Nagaraj, NS ; Kahng, Andrew ; Aitken, Rob ; Capodieci, Luigi ; Klass, Fabian ; Hou, Cliff ; Singh, Vivek
Author_Institution
Mentor Graphics Corp., San Jose, CA
fYear
2008
fDate
8-13 June 2008
Firstpage
898
Lastpage
899
Abstract
DFM has taken shape by virtue of manufacturers defining a series of "DFM activities", related to parametric and stochastic yield analysis and recommendations for design changes to improve yield. The picture is made more complex because the view from integrated device manufacturers, pure play foundries, and fabless semiconductor companies is not necessarily the same as they have different needs and constrains. This panel brings together DFM practitioners from each of these communities to discuss real experiences on the adoption level achieved so far as well as the impact in the manufactured products. The panel should be of interest of designers moving to advanced nodes (to learn from the experience of those that have "done it already") as well as those in the leading edge (such that they can compare experiences).
Keywords
file organisation; operating systems (computers); DFM; desktop file management; integrated device manufacturers; stochastic yield analysis; Design for manufacture; Foundries; Graphics; Instruments; Integrated circuit yield; Libraries; Lithography; Robustness; Semiconductor device manufacture; Shape; CMP; Critical Area Analysis; DFM; Lithography; OPC; Yield;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location
Anaheim, CA
ISSN
0738-100X
Print_ISBN
978-1-60558-115-6
Type
conf
Filename
4555947
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