• DocumentCode
    474569
  • Title

    DFM in practice: Hit or hype?

  • Author

    Rey, Juan C. ; Nagaraj, NS ; Kahng, Andrew ; Aitken, Rob ; Capodieci, Luigi ; Klass, Fabian ; Hou, Cliff ; Singh, Vivek

  • Author_Institution
    Mentor Graphics Corp., San Jose, CA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    898
  • Lastpage
    899
  • Abstract
    DFM has taken shape by virtue of manufacturers defining a series of "DFM activities", related to parametric and stochastic yield analysis and recommendations for design changes to improve yield. The picture is made more complex because the view from integrated device manufacturers, pure play foundries, and fabless semiconductor companies is not necessarily the same as they have different needs and constrains. This panel brings together DFM practitioners from each of these communities to discuss real experiences on the adoption level achieved so far as well as the impact in the manufactured products. The panel should be of interest of designers moving to advanced nodes (to learn from the experience of those that have "done it already") as well as those in the leading edge (such that they can compare experiences).
  • Keywords
    file organisation; operating systems (computers); DFM; desktop file management; integrated device manufacturers; stochastic yield analysis; Design for manufacture; Foundries; Graphics; Instruments; Integrated circuit yield; Libraries; Lithography; Robustness; Semiconductor device manufacture; Shape; CMP; Critical Area Analysis; DFM; Lithography; OPC; Yield;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555947