EBIC and HR-TEM study of catastrophic optical damaged high power multi-mode InGaAs-AlGaAs strained quantum well lasers

Author

Sin, Yongkun ; Presser, Nathan ; Foran, Brendan ; Moss, Steven C.

Author_Institution

Electron. & Photonics Lab., Aerosp. Corp., El Segundo, CA

fYear

2008

fDate

4-9 May 2008

Firstpage

1

Lastpage

2

Abstract

We report our investigation of catastrophic optical damaged high power multi-mode InGaAs-AlGaAs strained quantum well (QW) lasers using electron beam induced current (EBIC), focused ion beam (FIB), and high-resolution transmission electron microscope (HR-TEM) techniques.

Keywords

EBIC; III-V semiconductors; aluminium compounds; dislocations; focused ion beam technology; gallium arsenide; indium compounds; laser beams; laser reliability; quantum well lasers; transmission electron microscopy; EBIC; HR-TEM; InGaAs-AlGaAs; broad area lasers; catastrophic optical damage; dark line defects; dislocations; electron beam induced current; focused ion beam; high-resolution transmission electron microscope; multimode quantum well laser; semiconductor quantum well laser; strained quantum well laser; Diode lasers; Electron beams; Electron optics; Ion beams; Laser modes; Laser theory; Particle beam optics; Power lasers; Quantum well lasers; Semiconductor lasers; (140.5960) Semiconductor lasers; (230.5590) Quantum-well devices;

fLanguage

English

Publisher

iet

Conference_Titel

Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on

Conference_Location

San Jose, CA

Print_ISBN

978-1-55752-859-9

Type

conf

Filename

4572261