Title :
Catastrophic optical damage in high-power diode lasers monitored by real-time imaging
Author :
Ziegler, Mathias ; Tomm, Jens W. ; Elsaesser, Thomas ; Matthiesen, Clemens ; Sanayeh, Marwan Bou ; Brick, Peter
Author_Institution :
Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin
Abstract :
Combined thermal and near-field imaging monitors the catastrophic optical damage dynamics in diode lasers. Red-emitting high-power lasers display a very rapid and spatially confined catastrophic process with re-absorption as the key-mechanism of device degradation.
Keywords :
infrared imaging; laser beams; nondestructive testing; semiconductor lasers; catastrophic optical damage; device degradation; high-power diode lasers; near-field imaging; real-time imaging; red-emitting high-power lasers; spatially confined catastrophic process; thermal imaging; Diode lasers; Laser theory; Monitoring; Optical devices; Optical imaging; Optical pumping; Optical resonators; Rapid thermal processing; Semiconductor lasers; Temperature; (110.6820) Thermal imaging; (140.2020) Diode lasers;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
