• DocumentCode
    474821
  • Title

    Atom microscopy beyond diffraction limit by resonance fluorescence spectroscopy

  • Author

    Chang, Jun-Tao ; Evers, Jorg ; Scully, Marlan O. ; Zubairy, M. Suhail

  • Author_Institution
    Inst. for Quantum Studies & Dept. of Phys., Texas A&M Univ., College Station, TX
  • fYear
    2008
  • fDate
    4-9 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We proposed an atom microcopy scheme measuring distance between two identical atoms placed in a standing wave laser field by measuring fluorescence spectrum or g2 functionpsilas spectrum. It has fractional-wavelength precision from about lambda/550 to lambda/2 .
  • Keywords
    atomic force microscopy; fluorescence spectroscopy; light diffraction; atom microscopy; diffraction limit; fractional-wavelength precision; resonance fluorescence spectroscopy; standing wave laser field; Atom lasers; Atom optics; Atomic beams; Atomic measurements; Biomedical optical imaging; Diffraction; Fluorescence; Microscopy; Resonance; Spectroscopy; (180.2520) Fluorescence microscopy; (270.1670) Coherent Optical Effects;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-859-9
  • Type

    conf

  • Filename
    4572870
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=474821