Title :
Atom microscopy beyond diffraction limit by resonance fluorescence spectroscopy
Author :
Chang, Jun-Tao ; Evers, Jorg ; Scully, Marlan O. ; Zubairy, M. Suhail
Author_Institution :
Inst. for Quantum Studies & Dept. of Phys., Texas A&M Univ., College Station, TX
Abstract :
We proposed an atom microcopy scheme measuring distance between two identical atoms placed in a standing wave laser field by measuring fluorescence spectrum or g2 functionpsilas spectrum. It has fractional-wavelength precision from about lambda/550 to lambda/2 .
Keywords :
atomic force microscopy; fluorescence spectroscopy; light diffraction; atom microscopy; diffraction limit; fractional-wavelength precision; resonance fluorescence spectroscopy; standing wave laser field; Atom lasers; Atom optics; Atomic beams; Atomic measurements; Biomedical optical imaging; Diffraction; Fluorescence; Microscopy; Resonance; Spectroscopy; (180.2520) Fluorescence microscopy; (270.1670) Coherent Optical Effects;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
