• DocumentCode
    47484
  • Title

    Deriving Feature Fail Rate from Silicon Volume Diagnostics Data

  • Author

    Malik, Shobhit ; Herrmann, Thomas ; Madhavan, Sriram ; Desineni, Rao ; Schuermyer, Chris ; Eide, Geir

  • Volume
    30
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    26
  • Lastpage
    34
  • Abstract
    In this paper, we propose expanding the use of volume diagnostics to go beyond the identification of critical features to accurately estimate their FFRs. We present a case study where FFRs of a few critical features are identified using volume diagnostics. We also compare FFRs calculated from volume diagnostics to those extracted for the same feature on test structures, which validates our presented approach.
  • Keywords
    elemental semiconductors; fault diagnosis; integrated circuit design; integrated circuit testing; silicon; FFR; Si; feature fail rate; silicon volume diagnostics; Adaptation models; Debugging; Integrated circuits; Mathematical model; Software reliability; Systematics;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2273791
  • Filename
    6562792
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=47484