DocumentCode :
47488
Title :
Hydrogen Passivation of Laser-Induced Defects for Laser-Doped Silicon Solar Cells
Author :
Hallam, Brett ; Sugianto, Adeline ; Ly Mai ; GuangQi Xu ; Chan, Chi Hou ; Abbott, Malcolm ; Wenham, Stuart ; Uruena, Angel ; Cornagliotti, Emanuele ; Aleman, Monica
Author_Institution :
Sch. of Photovoltaic & Renewable Energy Eng., Univ. of New South Wales, Kensington, NSW, Australia
Volume :
4
Issue :
6
fYear :
2014
fDate :
Nov. 2014
Firstpage :
1413
Lastpage :
1420
Abstract :
Hydrogen passivation of laser-induced defects (LasID) is shown to be essential for the fabrication of laser-doped solar cells. On first-generation laser-doped selective emitter solar cells where open-circuit voltages were predominately limited by the full-area back surface field, a 10-mV increase and 0.4% increase in the pseudo-fill factor were observed through hydrogen passivation of defects generated during the laser doping process, resulting in an efficiency gain of 0.35% absolute. The passivation of such defects becomes of increasing importance when developing higher voltage devices and can result in improvements in implied open-circuit voltage on test structures up to 50 mV. On n-type PERT solar cells, an efficiency gain of 0.7% absolute was demonstrated with increases in open-circuit voltage and pseudo-fill factor by applying a short low-temperature hydrogenation process using only hydrogen within the device. This process was also shown to improve the rear surface passivation, increasing the short-circuit current of approximately 0.2 mA/cm2 of wavelengths from 950 to 1200 nm compared with that achieved using an Alneal process. Subsequently, an average efficiency of 20.54% was achieved.
Keywords :
crystal defects; elemental semiconductors; hydrogenation; laser materials processing; passivation; silicon; solar cells; Alneal process; Si; efficiency gain; first-generation laser-doped selective emitter solar cell; full-area back surface field; hydrogen passivation; laser-induced defect; low-temperature hydrogenation process; n-type PERT solar cell; open-circuit voltage; pseudo-fill factor; rear surface passivation; short-circuit current; Annealing; Doping; Hydrogen; Passivation; Photovoltaic cells; Defects; hydrogen passivation; laser doping;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2014.2347804
Filename :
6884800
Link To Document :
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