• DocumentCode
    474954
  • Title

    A new diagnosis algorithm for sensors based on morphology-wavelet

  • Author

    Hou, Guo-Lian ; Zhang, Yi ; Zhang, Jian-hua

  • Author_Institution
    Dept. of Autom., North China Electr. Power Univ., Beijing
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    970
  • Lastpage
    975
  • Abstract
    For the purpose of increasing the effectiveness of sensors used for control systems, a new fault detecting and diagnosing algorithm, using in connection with morphological -wavelet analysis, is being proposed. The mathematical characterization of singularities with Lipschitz exponents is explained. With the algorithm, firstly, generalized morphological filter with multi-structure elements is designed to filter the random noise and impulse noise in sensor´s input and output signals. And secondly, to effectively extract the incipient fault and abrupt fault characteristic, a wavelet transform was used to decompose and analyze the filtered signals in this paper. By the multi resolution analyzing (MRA), the fault can be located accurately. The type of abrupt and incipient fault concerned can simultaneously be distinguished by using Lipschitz exponent, according to the fault´s point of sudden change. The typical sensor faults such as fix, gain, bias, drift faults were studied. The simulation results show that this algorithm is capable of locating accurately and diagnosing effectively.
  • Keywords
    discrete event systems; fault diagnosis; impulse noise; process control; random noise; state estimation; wavelet transforms; Lipschitz exponents; control systems; fault detection; fault diagnosis; impulse noise; morphology-wavelet analysis; multi resolution analyzing; random noise; wavelet transform; Algorithm design and analysis; Control systems; Fault detection; Filters; Multiresolution analysis; Sensor phenomena and characterization; Sensor systems; Signal design; Wavelet analysis; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582659
  • Filename
    4582659