Title :
Impact of microgrids concept on low voltage network reliability
Author :
Liang Tao ; Schwaegerl, Christine ; Herrmann, N.
Author_Institution :
Siemens AG, Berlin
Abstract :
A collection of slides from the authorpsilas conference presentation is given.
Keywords :
power grids; power system reliability; low voltage network reliability; microgrids concept impact;
Conference_Titel :
SmartGrids for Distribution, 2008. IET-CIRED. CIRED Seminar
Conference_Location :
Frankfurt
Print_ISBN :
978-0-86341-935-5
