• DocumentCode
    475054
  • Title

    Impact of microgrids concept on low voltage network reliability

  • Author

    Liang Tao ; Schwaegerl, Christine ; Herrmann, N.

  • Author_Institution
    Siemens AG, Berlin
  • fYear
    2008
  • fDate
    23-24 June 2008
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    A collection of slides from the authorpsilas conference presentation is given.
  • Keywords
    power grids; power system reliability; low voltage network reliability; microgrids concept impact;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    SmartGrids for Distribution, 2008. IET-CIRED. CIRED Seminar
  • Conference_Location
    Frankfurt
  • ISSN
    0537-9989
  • Print_ISBN
    978-0-86341-935-5
  • Type

    conf

  • Filename
    4591801
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=475054