DocumentCode
475184
Title
Comparison of different nonlinear optical characterization techniques
Author
Boudebs, Georges ; Fedus, Kamil
Author_Institution
Lab. des Proprietes Opt. des Mater. et Applic., CNRS, Angers
Volume
1
fYear
2008
fDate
22-26 June 2008
Firstpage
228
Lastpage
231
Abstract
We present experimental and numerical results using different characterization techniques in order to obtain the third order nonlinear optical coefficients. Starting with the classical Z-scan method for materials having low optical quality, we describe also a spatially resolved Mach-Zehnder interferometry system as well as a simple imaging method using a 4f setup with a phase object at the entry. Some of these techniques are particularly appropriate to study fragile materials because the results can be obtained with a limited number of laser shots. In all cases, the nonlinearities are obtained by analyzing the intensity profiles of the image acquired with a CCD camera after nonlinear filtering through the material in a focal plane of a converging lens. Advantages and drawbacks are summarized for each technique.
Keywords
CCD image sensors; Mach-Zehnder interferometers; focal planes; nonlinear optical susceptibility; refractive index; CCD camera; Z-scan method; focal plane; spatially resolved Mach-Zehnder interferometry; third order nonlinear optical coefficients; Charge coupled devices; Charge-coupled image sensors; Image analysis; Image resolution; Nonlinear optics; Optical filters; Optical imaging; Optical interferometry; Optical materials; Spatial resolution; 4-f system; Fourier transform; Mach-Zehnder interferometer; Z-scan; nonlinear refractive index; third-order susceptibility;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks, 2008. ICTON 2008. 10th Anniversary International Conference on
Conference_Location
Athens
Print_ISBN
978-1-4244-2625-6
Electronic_ISBN
978-1-4244-2626-3
Type
conf
DOI
10.1109/ICTON.2008.4598414
Filename
4598414
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