Title :
Spectral Deconvolution and Feature Extraction With Robust Adaptive Tikhonov Regularization
Author :
Hai Liu ; Luxin Yan ; Yi Chang ; Houzhang Fang ; Tianxu Zhang
Author_Institution :
Sci. & Technol. on Multi-spectral Inf. Process. Lab., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
Raman spectral interpretation often suffers common problems of band overlapping and random noise. Spectral deconvolution and feature-parameter extraction are both classical problems, which are known to be difficult and have attracted major research efforts. This paper shows that the two problems are tightly coupled and can be successfully solved together. Mutual support of Raman spectral deconvolution and feature-extraction processes within a joint variational framework are theoretically motivated and validated by successful experimental results. The main idea is to recover latent spectrum and extract spectral feature parameters from slit-distorted Raman spectrum simultaneously. Moreover, a robust adaptive Tikhonov regularization function is suggested to distinguish the flat, noise, and points, which can suppress noise effectively as well as preserve details. To evaluate the performance of the proposed method, quantitative and qualitative analyses were carried out by visual inspection and quality indexes of the simulated and real Raman spectra.
Keywords :
Raman spectroscopy; adaptive signal processing; deconvolution; feature extraction; optical information processing; Raman spectral deconvolution; feature extraction processes; joint variational framework; robust adaptive Tikhonov regularization function; slit distorted Raman spectrum; Deconvolution; Feature extraction; Instruments; Kernel; Noise; Noise measurement; Robustness; Deconvolution; Raman spectroscopy; Tikhonov regularization (TR); feature extraction; peak detection; spectral analysis; variational method;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2012.2217636