Title :
Electrical characterization of a new enamel insulation
Author :
Hoang, Anh T. ; Serdyuk, Yuriy V. ; Gubanski, Stanislaw
Author_Institution :
High Voltage Eng., Chalmers Univ. of Technol., Gothenburg, Sweden
Abstract :
Investigations of dielectric properties of a newly developed enamel wire insulation created by adding chromium (III) oxide (Cr2O3) filler to polyamide-imide enamel base are presented. Results of measurements of electrical conductivity and complex permittivity at various temperatures as well as surface potential decay are discussed and compared with corresponding properties of standard enamel insulation. Contributions of different polarization relaxation processes in both enamels are examined based on the obtained master curves of dielectric response. In addition, the properties of chromium oxide filler are characterized separately and utilized further for analyzing its impact on the performance of enamel wire insulation by means of computer simulations. The experimental and simulated results demonstrate that the introduction of chromium oxide yields changes in the electrical properties that allow for mitigating the voltage stress in a wound insulation system. Furthermore, a correlation between the obtained results and the earlier described improved resistance to partial discharge activity of the chromium oxide filled enamel is discussed.
Keywords :
chromium compounds; electrical conductivity measurement; enamels; partial discharges; permittivity measurement; wires (electric); Cr2O3; chromium (III) oxide filler; complex permittivity; dielectric properties; dielectric response; electrical conductivity measurements; electrical properties; enamel wire insulation; partial discharge; polarization relaxation process; polyamide-imide enamel base; surface potential decay; voltage stress mitigation; wound insulation system; Chromium; Conductivity; Conductivity measurement; Insulation; Standards; Temperature measurement; Voltage measurement; Enamel insulation; conductivity measurement; dielectric losses; dielectric polarization; permittivity measurement; surface potential decay;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2014.6832277