DocumentCode :
475467
Title :
Sensitivity analysis of VLSI interconnect output signal
Author :
Ligocka, A. ; Bandurski, W.
Author_Institution :
Poznan Univeristy of Technology, POLAND
fYear :
2008
fDate :
19-21 June 2008
Firstpage :
437
Lastpage :
441
Abstract :
Interconnect parameters play an important role in signal propagation in VLSI systems. In the paper we present the sensitivity analysis to parameters of typical on-chip interconnects for the step and ramp response. In the paper we show also the sensitivity to parameters for the threshold crossing time. We compute the output response of the interconnect and the threshold crossing time formulas based on the multiple scales method.
Keywords :
Clocks; Computational modeling; Impedance; Integrated circuit interconnections; Inverters; Propagation losses; RLC circuits; Sensitivity analysis; Transmission lines; Very large scale integration; RLC interconnect model; Sensitivity analysis; Threshold crossing times;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on
Conference_Location :
Poznan, Poland
Print_ISBN :
978-83-922632-7-2
Electronic_ISBN :
978-83-922632-8-9
Type :
conf
Filename :
4600953
Link To Document :
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