Title :
Development of PT Secondary Circuit´s Drop Test Instrument Based on dsPIC30F6010 Singlechip
Author :
Li, Haiquan ; Zhang, Shuguang ; Zhang, Dening ; Kou, Hongjuan ; Zhang, Shan
Author_Institution :
Sch. of Mech. & Electr. Eng., Agric. Univ. of Hebei, Baoding
Abstract :
In the comprehensive error of energy metering device, only metering error of voltage drop of TV secondary circuit can be reduced by some technical improvement measures. This paper introduces a portable intellectual instrument used to measure PT secondary drop of voltage transformer based on metering, while relying on dsPIC30F6010 single chip, as well as the form of hardware and procedure of software.
Keywords :
electric potential; potential transformers; power measurement; power meters; PT secondary circuit; TV secondary circuit; drop test instrument; dsPIC30F6010 singlechip; energy metering device; portable intellectual instrument; voltage drop; voltage transformer; Cables; Circuit testing; Current measurement; Current transformers; Electric variables measurement; Instruments; Power measurement; Semiconductor device measurement; TV; Voltage transformers; Harvard Construction; PT secondary drop; difference measurement; embedded system; voltage transformer;
Conference_Titel :
Computing, Communication, Control, and Management, 2008. CCCM '08. ISECS International Colloquium on
Conference_Location :
Guangzhou
Print_ISBN :
978-0-7695-3290-5
DOI :
10.1109/CCCM.2008.267
