• DocumentCode
    475942
  • Title

    Average neighborhood margin maximization projection with smooth regularization for face recognition

  • Author

    Liu, Xiao-ming ; Wang, Zhao-hui ; Feng, Zhi-lin

  • Author_Institution
    Coll. of Comput. Sci. & Technol., Wuhan Univ. of Sci. & Technol., Wuhan
  • Volume
    1
  • fYear
    2008
  • fDate
    12-15 July 2008
  • Firstpage
    401
  • Lastpage
    406
  • Abstract
    Dimensionality reduction is among the keys in many fields, most of the traditional method can be categorized as local or global ones. In this paper, we consider the dimension reduction problem with prior information is available, namely, semi-supervised dimension reduction. A new dimension reduction method that can explore both the labeled and unlabeled information in the dataset is proposed. The labeled data points are used to maximize the separability between different classes and the unlabeled data points are used to estimate the intrinsic geometric structure of the data. Specifically, we aim to learn a discriminant function which is as smooth as possible on the data manifold. The target optimization problem involved can be solved efficiently with eigenvalue decomposition. Experimental results on several datasets demonstrate the effectiveness of our method.
  • Keywords
    data reduction; eigenvalues and eigenfunctions; face recognition; optimisation; average neighborhood margin maximization projection; eigenvalue decomposition; face recognition; semisupervised dimension reduction; smooth regularization; target optimization; Cybernetics; Educational institutions; Eigenvalues and eigenfunctions; Face recognition; Kernel; Linear discriminant analysis; Machine learning; Principal component analysis; Scattering; Semisupervised learning; Dimension Reduction; Linear Discriminant Analysis; Semi-Supervised Learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2008 International Conference on
  • Conference_Location
    Kunming
  • Print_ISBN
    978-1-4244-2095-7
  • Electronic_ISBN
    978-1-4244-2096-4
  • Type

    conf

  • DOI
    10.1109/ICMLC.2008.4620439
  • Filename
    4620439