• DocumentCode
    475944
  • Title

    Feature selection based on scatter degree

  • Author

    Xu, Jun-ling ; Xu, Bao-wen ; Wang, Cong ; Cui, Zi-feng

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing
  • Volume
    1
  • fYear
    2008
  • fDate
    12-15 July 2008
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    Feature selection is an important task in machine learning, pattern recognition and data mining. This paper proposed a new feature selection method for classification, named SD, which is based on scatter matrix used in linear discriminant analysis. The main feature of SD is its simplicity and independency of learning algorithms. High-dimensional data samples are first projected into a lower dimensional subspace of the original feature space by means of a linear transformation matrix, which can be attained according to the scatter degree of each feature, and then the scatter degree is used to measure the importance of each feature. A comparison of SD and some popular feature selection methods (information gain and chi2-test) is conducted, and the results of experiment carried out on 19 data sets show the advantages of SD.
  • Keywords
    data mining; feature extraction; learning (artificial intelligence); matrix algebra; pattern classification; data mining; feature selection; high-dimensional data samples; linear discriminant analysis; linear transformation matrix; lower dimensional subspace; machine learning; pattern recognition; scatter degree; scatter matrix; Cybernetics; Data mining; Feature extraction; Iron; Linear discriminant analysis; Machine learning; Machine learning algorithms; Pattern recognition; Principal component analysis; Scattering; Data mining; Feature selection; Scatter degree;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2008 International Conference on
  • Conference_Location
    Kunming
  • Print_ISBN
    978-1-4244-2095-7
  • Electronic_ISBN
    978-1-4244-2096-4
  • Type

    conf

  • DOI
    10.1109/ICMLC.2008.4620442
  • Filename
    4620442