DocumentCode
475996
Title
Localized generalization error model for Multilayer Perceptron Neural Networks
Author
Yang, Fei ; Ng, Wing W Y ; Tsang, Eric C C ; Zeng, Xiao-qin ; Yeung, Daniel S.
Author_Institution
Shenzhen Grad. Sch., Harbin Inst. of Technol., Harbin
Volume
2
fYear
2008
fDate
12-15 July 2008
Firstpage
794
Lastpage
799
Abstract
In this work, the localized generalization error model (L-GEM) for multilayer perceptron neural network (MLPNN) is derived. The L-GEM is inspired by the fact that a classifier should not be required to recognize unseen samples that are very different from the training samples. Therefore, evaluating a classifier by very different unseen samples may be counter-productive. In the L-GEM, the ldquolocalrdquo is defined by the difference between feature values of unseen samples and training samples is less than a given real value (Q). The L-GEM provides an upper bound of the mean-square-error of unseen samples ldquolocalrdquo to the training dataset. As the generalization capability of a MLPNN is the key evaluation criterion of a successful training of MLPNN, we select the number of hidden neurons of a MLPNN using the L-GEM. The experimental results on four UCI datasets show that the proposed L-GEM yields better MLPNNs with higher generalization power (testing accuracy) and smaller number of hidden neurons.
Keywords
mean square error methods; multilayer perceptrons; neural nets; L-GEM; MLPNN; UCI datasets; evaluation criterion; localized generalization error model; mean-square-error; multilayer perceptron neural networks; stochastic sensitivity measure; Artificial neural networks; Computer errors; Computer networks; Evolutionary computation; Function approximation; Machine learning; Multi-layer neural network; Multilayer perceptrons; Neural networks; Neurons; Architecture Selection; Localized Generalization Error bound; Multilayer Perceptron Neural Network; Stochastic Sensitivity Measure;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics, 2008 International Conference on
Conference_Location
Kunming
Print_ISBN
978-1-4244-2095-7
Electronic_ISBN
978-1-4244-2096-4
Type
conf
DOI
10.1109/ICMLC.2008.4620512
Filename
4620512
Link To Document