DocumentCode :
475996
Title :
Localized generalization error model for Multilayer Perceptron Neural Networks
Author :
Yang, Fei ; Ng, Wing W Y ; Tsang, Eric C C ; Zeng, Xiao-qin ; Yeung, Daniel S.
Author_Institution :
Shenzhen Grad. Sch., Harbin Inst. of Technol., Harbin
Volume :
2
fYear :
2008
fDate :
12-15 July 2008
Firstpage :
794
Lastpage :
799
Abstract :
In this work, the localized generalization error model (L-GEM) for multilayer perceptron neural network (MLPNN) is derived. The L-GEM is inspired by the fact that a classifier should not be required to recognize unseen samples that are very different from the training samples. Therefore, evaluating a classifier by very different unseen samples may be counter-productive. In the L-GEM, the ldquolocalrdquo is defined by the difference between feature values of unseen samples and training samples is less than a given real value (Q). The L-GEM provides an upper bound of the mean-square-error of unseen samples ldquolocalrdquo to the training dataset. As the generalization capability of a MLPNN is the key evaluation criterion of a successful training of MLPNN, we select the number of hidden neurons of a MLPNN using the L-GEM. The experimental results on four UCI datasets show that the proposed L-GEM yields better MLPNNs with higher generalization power (testing accuracy) and smaller number of hidden neurons.
Keywords :
mean square error methods; multilayer perceptrons; neural nets; L-GEM; MLPNN; UCI datasets; evaluation criterion; localized generalization error model; mean-square-error; multilayer perceptron neural networks; stochastic sensitivity measure; Artificial neural networks; Computer errors; Computer networks; Evolutionary computation; Function approximation; Machine learning; Multi-layer neural network; Multilayer perceptrons; Neural networks; Neurons; Architecture Selection; Localized Generalization Error bound; Multilayer Perceptron Neural Network; Stochastic Sensitivity Measure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics, 2008 International Conference on
Conference_Location :
Kunming
Print_ISBN :
978-1-4244-2095-7
Electronic_ISBN :
978-1-4244-2096-4
Type :
conf
DOI :
10.1109/ICMLC.2008.4620512
Filename :
4620512
Link To Document :
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