Title :
TrustRRM: An Improved Reputation Management Scheme Handling Dishonest Feedback in Peer-to-Peer Networks
Author :
Shin, Junghwa ; Kim, Taehoon ; Tak, Sungwoo
Author_Institution :
Sch. of Comput. Sci. & Eng., Pusan Nat. Univ., Busan
Abstract :
Because the P2P networks have no trusted third parties that can manage the behaviors of peers and control the malicious peers, peers can give harm to correct peers by providing inauthentic resources for the benefit of themselves in resource sharing service. Under this situation, peers can refer the reputation that reflects peer´s past behaviors to download the authentic resources from reliable peers. In the utilization of reputation, sometimes peers intentionally can give a dishonest feedback to fake the reputation of other peers. Therefore, we propose a new reputation management scheme, called TrustRRM (Trusty Reputation Management for Resource Sharing Service) that can manage the dishonest feedback of peers and improve the reliability of resource sharing service. We compare the effectiveness of TrustRRM scheme, and existing reputation management schemes using NS-2 Simulator. A case study on practical experiments and simulations show that the TrustRRM scheme yields better performance in terms of download ratio of inauthentic resources, success ratio of download request, and in/out-degrees of malicious and good peer.
Keywords :
authorisation; peer-to-peer computing; telecommunication security; NS-2 Simulator; TrustRRM; Trusty Reputation Management for Resource Sharing Service; dishonest feedback handling; malicious peers; peer-to-peer networks; trusted third parties; Computational modeling; Computer network management; Computer networks; Computer science; Conference management; Engineering management; Feedback; Information management; Peer to peer computing; Resource management; False Feedback; P2P; Reputation;
Conference_Titel :
Networked Computing and Advanced Information Management, 2008. NCM '08. Fourth International Conference on
Conference_Location :
Gyeongju
Print_ISBN :
978-0-7695-3322-3
DOI :
10.1109/NCM.2008.82