• DocumentCode
    47644
  • Title

    The Establishment of High DC Shunt Calibration System at KRISS and Comparison With NRC

  • Author

    Kyu-Tae Kim ; Jae Kap Jung ; Young Seob Lee ; So, Eddy ; Bennett, David

  • Author_Institution
    Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
  • Volume
    64
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1364
  • Lastpage
    1368
  • Abstract
    The application of a binary step-up method has been investigated at the Korea Research Institute of Standards and Science (KRISS) for establishment of high dc standards based on the calibration system of high dc shunts up to a few thousand amperes in which the current dependence of the shunt resistance can be measured. A successive step-up method with a pair of high dc shunts was suggested to link the unknown high current to the values of low current level which are already known. The step-up approach was further modified with employing a current monitor to extract the information on the current dependence of the shunt and the source current changes during the step-up measurement. To validate the modified step-up technology, a comparison of high dc shunt resistance was carried out with National Research Council (NRC) in which both the KRISS and the NRC results agreed well within the standard deviation of the measurement on the order of about 0.01%.
  • Keywords
    calibration; electric current measurement; electric resistance measurement; measurement standards; KRISS; Korea Research Institute of Standards and Science; NRC; National Research Council; binary step-up measurement method; high DC shunt calibration system; high DC standard; shunt resistance measurement; source current; Calibration; Current measurement; Electrical resistance measurement; Resistance; Standards; Temperature measurement; Voltage measurement; Calibration; current measurement; current supplies; current transformers; electrical resistance measurement; shunts; shunts.;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2015.2399022
  • Filename
    7097050