DocumentCode :
476508
Title :
Statistical VNA calibration technique using thru and multiple reflect terminations
Author :
Wiatr, Wojciech
Author_Institution :
Inst. of Electron. Syst., Warsaw Univ. of Technol., Warsaw
fYear :
2008
fDate :
19-21 May 2008
Firstpage :
1
Lastpage :
2
Abstract :
A novel statistical technique for calibrating vector network analyzer (VNA) with zero-length thru and multiple-reflect terminations is presented. The terminations are assumed to be of the same type, e.g. offset terminations of different lengths with partly unknown characteristics. Their reflection coefficients are modeled over frequency and identified in the calibration together with the VNA error terms. Experiments have verified high accuracy of this new technique.
Keywords :
calibration; network analysers; statistical analysis; calibration technique; multiple-reflect terminations; statistical technique; vector network analyzer; zero-length thru terminations; Calibration; Circuits; Frequency; Impedance; Length measurement; Optical reflection; Propagation constant; Time measurement; Transmission line theory; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2008. MIKON 2008. 17th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-83-906662-8-0
Type :
conf
Filename :
4630151
Link To Document :
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