Title :
Mesurements of thin resistive films employing split post dielectric resonator technique
Author :
Krupka, Jerzy ; Jacob, Mohan ; Givot, Bradley L. ; Derzakowski, K.
Author_Institution :
Dept. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Warsaw
Abstract :
Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterned metal films deposited on a thin low loss dielectric substrate.
Keywords :
dielectric resonators; surface resistance; thin films; dielectric substrates; metal film deposition; split post dielectric resonator technique; surface resistance measurements; thin cermet; thin resistive film measurements; Conductive films; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electrical resistance measurement; Permittivity; Q factor; Surface resistance; Surface resistance; cermet resistors; thin metal films;
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2008. MIKON 2008. 17th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-83-906662-8-0
