DocumentCode :
477159
Title :
Two-dimensional locality sensitive discriminant analysis
Author :
Wei, Yantao ; Li, Hong ; Xia, Tian
Author_Institution :
Inst. for Pattern Recognition & Artifcial Intell., Huazhong Univ. of Sci. & Technol., Wuhan
Volume :
1
fYear :
2008
fDate :
30-31 Aug. 2008
Firstpage :
416
Lastpage :
420
Abstract :
Recently, locality sensitive discriminant analysis (LSDA) was proposed for dimensionality reduction. As far as matrix data, such as images, they are often vectorized for LSDA algorithm to find the intrinsic manifold structure. Such a matrix-to-vector transform may cause the loss of some structural information residing in original 2D images. Firstly, this paper proposes an algorithm named two-dimensional locality sensitive discriminant analysis (2DLSDA), which directly extracts the proper features from image matrices based on LSDA algorithm. And the experimental results on the ORL database show the effectiveness of the proposed algorithm. After that, 2DLSDA plus Fisherface, which was presented for the further dimensionality reduction, was compared with other dimention reduction methods, namely Eigenface, LSDA and 2DLSDA plus PCA. Experiments show that conducting Fisherface after 2DLSDA achieves high recognition accuracy.
Keywords :
data reduction; feature extraction; image recognition; image representation; learning (artificial intelligence); matrix algebra; statistical analysis; transforms; vectors; 2D image matrix-to-vector transform; 2D locality sensitive discriminant analysis algorithm; dimensionality reduction; feature extraction; image recognition; image representation; intrinsic manifold structure; Algorithm design and analysis; Data visualization; Machine learning; Mathematics; Pattern analysis; Pattern recognition; Principal component analysis; Statistical analysis; Testing; Wavelet analysis; Face recognition; Locality sensitive discriminant analysis; Manifold learning; Two-dimensional locality sensitive discriminant analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2238-8
Electronic_ISBN :
978-1-4244-2239-5
Type :
conf
DOI :
10.1109/ICWAPR.2008.4635815
Filename :
4635815
Link To Document :
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