SoC prototyping environment for electromagnetic immunity measurements

Author

Vargas, F. ; Benfica, J. ; Piccoli, L. ; Moraes, M. ; Gatti, E. ; Garcia, L. ; Lupi, D. ; Hernandez, F.

Author_Institution

Electr. Eng. Dept., Pontifical Catholic Univ. of Rio Grande do Sul, Porto Alegre

fYear

2008

fDate

18-19 Sept. 2008

Firstpage

6

Lastpage

10

Abstract

We present a configurable standard environment for electromagnetic (EM) immunity measurement of prototype system-on-chip (SoC). The environment is composed of two boards compliant with the 62.132-2 and 62.132-4 IEC Std Parts, being conceived for radiated and conducted measurements, respectively. The SoC under test can be prototyped on two types of ICs: two FPGAs and a microcontroller. Practical experiments have been carried out. The obtained results demonstrate the utility and benefits from using the proposed platform to estimate in an early stage of the design process the behavior of embedded systems operating in EM environment.

Keywords

electromagnetic interference; immunity testing; microcontrollers; system-on-chip; SoC prototyping environment; electromagnetic immunity measurement; microcontroller; prototype system-on-chip; Electromagnetic measurements; Electromagnetic radiation; Field programmable gate arrays; IEC standards; Measurement standards; Microcontrollers; Process design; Prototypes; System-on-a-chip; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Micro-Nanoelectronics, Technology and Applications, 2008. EAMTA 2008. Argentine School of

Conference_Location

Buenos Aires

Print_ISBN

978-987-655-003-1

Electronic_ISBN

978-987-655-003-1

Type

conf

Filename

4638968