• DocumentCode
    477334
  • Title

    Plasma immersion ion implantation with lithium atoms

  • Author

    Oliveira, R.M. ; Ueda, M. ; Rossi, J.O. ; Diaz, B.

  • Author_Institution
    National Institute for Space Research, PO Box 515, ZIP 12245-970, São José dos Campos, São Paulo, Brazil
  • Volume
    1
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    850
  • Lastpage
    852
  • Abstract
    A new method was developed with the aim to creating plasma of lithium for plasma immersion ion implantation. First an argon glow discharge with operation pressure ranging from 2 × 10−2 mbar to 1 mbar is generated by negatively polarizing an electrode from −400 V to −1500 V. Small pieces of metallic lithium, 99.9% pure; fill the top of a conic crucible, with 2 cm depth, in electric contact with the electrode. Argon ions from the plasma are used to bombard this target where heat is created by the momentum transfer between the impacting ions and the crucible. By controlling the operation pressure and the electrode voltage polarization it is possible to easily heat the crucible to temperatures above the lithium melting point (180 °C), causing its evaporation. Lithium atoms are then ionized due to collisions with plasma particles. Double Langmuir probe measurements indicated variation on the density of the discharge from 4×109 cm−3 to 1010 cm−3, after lithium evaporation. Silicon wafer pieces immersed into this mixed plasma were submitted to repetitive negative high voltage pulses (3 kV/6 μs/3 kHz), in order to attract plasma ions. High resolution X-Ray diffraction performed in these samples revealed the presence of high strain on the analyzed layers, in comparison with samples submitted just to the argon discharge.
  • Keywords
    Argon; Electrodes; Glow discharges; Lithium; Plasma density; Plasma immersion ion implantation; Plasma measurements; Plasma temperature; Plasma x-ray sources; Polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4651972
  • Filename
    4651972