DocumentCode
477392
Title
Power consumption and chip area reduction techniques for MB-OFDM UWB RFICs
Author
Zhang, Zisan ; Mertens, Koen ; Tiebout, Marc ; Marsili, Stefano ; Matveev, Denis ; Sandner, Christoph
Author_Institution
Dev. Center Villach, Infineon Technol. AG, Villach
Volume
2
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
69
Lastpage
72
Abstract
For MB-OFDM UWB systems with worldwide interoperability the band group 1, 3 and 6 should be included. Multiple bands, high frequency and wideband operation pushes the classical implementation to physically big chip area and high power consumption. Using the latest deep submicron CMOS technology can solve this problem in digital circuits, however it is not in favor of RF and analog performance; furthermore the time spent on characterizing the latest process can significantly increase the development cost and delay the time to market. In this paper, power consumption and chip area reduction techniques in both system concept and transistor level design are proposed; and they are verified by some low-power high performance MB-OFDM UWB RF ICs in a digital 90 nm CMOS technology. The results demonstrate that with the proposed techniques, power consumption and chip area can be reduced significantly.
Keywords
CMOS digital integrated circuits; OFDM modulation; radiofrequency integrated circuits; ultra wideband communication; MB-OFDM UWB RFIC; chip area reduction techniques; digital circuits; power consumption; size 90 nm; submicron CMOS technology; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS process; CMOS technology; Costs; Digital circuits; Energy consumption; Radio frequency; Radiofrequency integrated circuits; Wideband; CMOS; IQ modulator; MB-OFDM; RF transceiver; Ultra wideband; active inductor; chip area reduction; direct-conversion; fast-hopping frequency generation; low-power; power amplifier; stacked inductor; sub-harmonic injection locking;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultra-Wideband, 2008. ICUWB 2008. IEEE International Conference on
Conference_Location
Hannover
Print_ISBN
978-1-4244-2216-6
Electronic_ISBN
978-1-4244-1827-5
Type
conf
DOI
10.1109/ICUWB.2008.4653353
Filename
4653353
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