• DocumentCode
    478757
  • Title

    Feature Analysis and De-noising of MRS Data Based on Pattern Recognition and Wavelet Transform

  • Author

    Dong, Guangbo ; Ma, Jian ; Xie, Guihai ; Sun, Zengqi

  • Author_Institution
    Dept. of Comput. Eng., Ordnance Eng. Coll., Shijiazhuang
  • Volume
    1
  • fYear
    2006
  • fDate
    20-24 June 2006
  • Firstpage
    278
  • Lastpage
    282
  • Abstract
    De-noising the MRS data is a key processing in analysis of spectroscopy MRS data. This paper presents an effective method based on wavelet-transform and pattern recognition technologies. Upon the characteristics of MRS data, a new wavelet basis function was designed, and a de-noising method of free induction decay (FID) data using wavelet threshold to obtain better MRS spectrums was conduced; hence, the features of some cancers from MRS spectrums based on independent component analysis (ICA) and support vector machine (SVM) were extended. Comparing with the de-nosing effect using conventional wavelet basis functions, experiments were conducted to validate that the innovative feature extraction method employing ICA and a new wavelet filter set has higher and better performance. Experiments in this study were carried out on a small amount of real and low SNR dataset that obtained from the GE NMR device. The experimental results showed that the proposed de-nosing method improves its efficiency of feature extraction significantly
  • Keywords
    biomedical MRI; cancer; data analysis; feature extraction; image denoising; image recognition; independent component analysis; magnetic resonance spectroscopy; medical image processing; support vector machines; wavelet transforms; MRS data denoising; MRS data feature analysis; SVM; cancer; feature extraction method; free induction decay data; independent component analysis; pattern recognition; spectroscopy MRS data analysis; support vector machine; wavelet basis function; wavelet filter; wavelet threshold; wavelet transform; Cancer; Feature extraction; Independent component analysis; Noise reduction; Pattern analysis; Pattern recognition; Spectroscopy; Support vector machines; Wavelet analysis; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Computational Sciences, 2006. IMSCCS '06. First International Multi-Symposiums on
  • Conference_Location
    Hanzhou, Zhejiang
  • Print_ISBN
    0-7695-2581-4
  • Type

    conf

  • DOI
    10.1109/IMSCCS.2006.64
  • Filename
    4673559