DocumentCode :
47935
Title :
Ultra Low Power Magnetic Flip-Flop Based on Checkpointing/Power Gating and Self-Enable Mechanisms
Author :
Chabi, Djaafar ; Weisheng Zhao ; Erya Deng ; Yue Zhang ; Ben Romdhane, N. ; Klein, Jacques-Olivier ; Chappert, Claude
Author_Institution :
IEF, Univ. Paris-Sud, Orsay, France
Volume :
61
Issue :
6
fYear :
2014
fDate :
Jun-14
Firstpage :
1755
Lastpage :
1765
Abstract :
Advanced computing systems suffer from high static power due to the rapidly rising leakage currents in deep sub-micron MOS technologies. Fast access non-volatile memories (NVM) are under intense investigation to be integrated in Flip-Flops or computing memories to allow system power-off in standby state and save power. Spin Transfer Torque MRAM (STT-MRAM) is considered the most promising NVM to address this issue thanks to its high speed, low power, and infinite endurance. However, one of the disadvantages of STT-MRAM for the computing purpose is its relatively high write energy to build up Magnetic Flip-Flop (MFF). In this paper, we propose a power-efficient MFF design architecture to address this challenge based on the combination of checkpointing operation, power gating and self-enable mechanisms. Multi non-volatile storages can be integrated locally in a conventional FF without significant area overhead benefiting from the 3-D implementation of STT-MRAM. We performed electrical simulations (i.e. transient and statistical) to validate its functional behaviors and evaluate its performance by using an accurate spice model of STT-MRAM and an industrial 40 nm CMOS design kit. The simulation results confirm its lower power consumption compared to conventional CMOS FF and the other structures.
Keywords :
CMOS integrated circuits; checkpointing; flip-flops; power aware computing; CMOS design; NVM; SPICE model; STT-MRAM; checkpointing mechanism; complimentary metal oxide semiconductors; metal oxide semiconductor; nonvolatile memories; power gating mechanism; power-efficient MFF design architecture; self-enable mechanisms; size 40 nm; spin transfer torque MRAM; submicron MOS technologies; ultra low power magnetic flip-flop; CMOS integrated circuits; Checkpointing; Computer architecture; Flip-flops; Nonvolatile memory; Registers; Switches; Checkpointing; STT-MRAM; flip-flop; low power; non-volatile; register; rollback; stochastic switching;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2013.2295026
Filename :
6701399
Link To Document :
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