DocumentCode :
479506
Title :
Effects of composition and volume on the microstructure of SnAgCu solder balls
Author :
Mueller, Maik ; Wiese, Steffen ; Wolter, Klaus-juergen
Author_Institution :
Electron. Packaging Lab., TU Dresden, Dresden
fYear :
2008
fDate :
1-4 Sept. 2008
Firstpage :
749
Lastpage :
756
Abstract :
In this study the solder alloys SnAg3.5, SnCu0.7, SnAg3.0Cu0.5, SnAg2.7Cu0.4Ni0.005 and SnAg3.8Cu0.7 have been analysed in order to determine variations in microstructure caused by cooling rate, solder composition and ball diameter. These specimens have been melted and solidified on an alumina substrate in order to prevent compositional changes due to interfacial reactions. The ball diameter was varied from approx. Oslash 1100 mum to Oslash 130 mum. Cooling rates of 0.14 K/s, 1.1 K/s and 10.9 K/s have been investigated. Cross sections of these specimens were analysed by optical light microscopy. The results show that the formation of primary intermetallics in these solder alloys depends on cooling rate and not only on composition. The analysis of grain orientation by polarized light microscopy points out the influences of volume and composition on the solder. The results also indicate that the grain structure becomes finer with smaller volume. A special solidification phenomena, which causes an abrupt change of grain size in a solder ball has been investigated for the SnAg3.0Cu0.5 alloy. It will be shown that this effect is connected with a change in the solidification process itself. In determine the influence on the solidification process caused by the interfacial reaction, experiments on Cu/Sn and Ni/Au metallisations have been carried out.
Keywords :
cooling; copper alloys; grain size; interconnections; melting; metallisation; optical microscopy; silver alloys; solders; solidification; tin alloys; SnAg2.7Cu0.4Ni0.005; SnAg3.0Cu0.5; SnAg3.5; SnAg3.8Cu0.7; SnCu0.7; alumina substrate; ball diameter; cooling rate; grain orientation; grain size; grain structure; interfacial reaction; melting; metallisations; optical light microscopy; polarized light microscopy; solder alloys; solder ball microstructure; solder composition; solidification; Ceramics; Cooling; Electronics packaging; Grain size; Microstructure; Optical microscopy; Optical polarization; Preforms; Soldering; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location :
Greenwich
Print_ISBN :
978-1-4244-2813-7
Electronic_ISBN :
978-1-4244-2814-4
Type :
conf
DOI :
10.1109/ESTC.2008.4684444
Filename :
4684444
Link To Document :
بازگشت