DocumentCode
479571
Title
Confidence intervals for multiple-stream yield index SpkM
Author
Wang, Dja-Shin ; Wu, Chieh-Ming ; Shen, Chien-Hua ; Wang, Wan-Erh
Author_Institution
Dept. of Bus. Adm., Transworld Inst. of Technol., Douliou
Volume
1
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
361
Lastpage
365
Abstract
Wang et al. [1] proposed a multiple-stream yield index Spk M. In addition to the point estimation, such as interval estimation are also important. In this paper we derived explicit forms of the cumulative distribution function and the probability density function of the estimated index Spk M. We developed a practical procedure and formula to provide practitioners an efficient tool for interval estimation on the yield index Spk M. An application example is illustrated. The procedure and formula are effective and easy to used, and should be expectant for in-plant applications.
Keywords
electronics packaging; industrial plants; manufacturing industries; probability; process capability analysis; semiconductor device manufacture; cumulative distribution function; industrial plant; manufacturing industry; multiple-stream yield index; probability density function; process capability indices; wafer package manufacturing process; Business communication; Distribution functions; Gaussian distribution; Magnetic heads; Manufacturing industries; Probability density function; Product design; Technology management; Workstations; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Service Operations and Logistics, and Informatics, 2008. IEEE/SOLI 2008. IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2012-4
Electronic_ISBN
978-1-4244-2013-1
Type
conf
DOI
10.1109/SOLI.2008.4686421
Filename
4686421
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