• DocumentCode
    479571
  • Title

    Confidence intervals for multiple-stream yield index SpkM

  • Author

    Wang, Dja-Shin ; Wu, Chieh-Ming ; Shen, Chien-Hua ; Wang, Wan-Erh

  • Author_Institution
    Dept. of Bus. Adm., Transworld Inst. of Technol., Douliou
  • Volume
    1
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    361
  • Lastpage
    365
  • Abstract
    Wang et al. [1] proposed a multiple-stream yield index Spk M. In addition to the point estimation, such as interval estimation are also important. In this paper we derived explicit forms of the cumulative distribution function and the probability density function of the estimated index Spk M. We developed a practical procedure and formula to provide practitioners an efficient tool for interval estimation on the yield index Spk M. An application example is illustrated. The procedure and formula are effective and easy to used, and should be expectant for in-plant applications.
  • Keywords
    electronics packaging; industrial plants; manufacturing industries; probability; process capability analysis; semiconductor device manufacture; cumulative distribution function; industrial plant; manufacturing industry; multiple-stream yield index; probability density function; process capability indices; wafer package manufacturing process; Business communication; Distribution functions; Gaussian distribution; Magnetic heads; Manufacturing industries; Probability density function; Product design; Technology management; Workstations; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service Operations and Logistics, and Informatics, 2008. IEEE/SOLI 2008. IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2012-4
  • Electronic_ISBN
    978-1-4244-2013-1
  • Type

    conf

  • DOI
    10.1109/SOLI.2008.4686421
  • Filename
    4686421