DocumentCode :
479571
Title :
Confidence intervals for multiple-stream yield index SpkM
Author :
Wang, Dja-Shin ; Wu, Chieh-Ming ; Shen, Chien-Hua ; Wang, Wan-Erh
Author_Institution :
Dept. of Bus. Adm., Transworld Inst. of Technol., Douliou
Volume :
1
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
361
Lastpage :
365
Abstract :
Wang et al. [1] proposed a multiple-stream yield index Spk M. In addition to the point estimation, such as interval estimation are also important. In this paper we derived explicit forms of the cumulative distribution function and the probability density function of the estimated index Spk M. We developed a practical procedure and formula to provide practitioners an efficient tool for interval estimation on the yield index Spk M. An application example is illustrated. The procedure and formula are effective and easy to used, and should be expectant for in-plant applications.
Keywords :
electronics packaging; industrial plants; manufacturing industries; probability; process capability analysis; semiconductor device manufacture; cumulative distribution function; industrial plant; manufacturing industry; multiple-stream yield index; probability density function; process capability indices; wafer package manufacturing process; Business communication; Distribution functions; Gaussian distribution; Magnetic heads; Manufacturing industries; Probability density function; Product design; Technology management; Workstations; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Service Operations and Logistics, and Informatics, 2008. IEEE/SOLI 2008. IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2012-4
Electronic_ISBN :
978-1-4244-2013-1
Type :
conf
DOI :
10.1109/SOLI.2008.4686421
Filename :
4686421
Link To Document :
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