An Improved AETG Test Suite Optimization Method Based on Regressing Test Model

Author

Li, Kewen ; Yang, Zhixia

Author_Institution

Coll. of Comput. & Commun. Eng., China Univ. of Pet., Dongying

Volume

2

fYear

2008

fDate

12-14 Dec. 2008

Firstpage

52

Lastpage

55

Abstract

Optimizing test suite can reduce the cost of time and resources, and improve the efficiency of regression test when test cases are generated. In this paper, the effect of factorspsila combination in systems is considered sufficiently, and an improved AETG pair-wise cover technique is proposed. The method of schema matching is used in the process of selecting level values of factors, so that the quantity of redundant test cases and the selecting time can be decreased. The method can generate fewer test cases sooner than the original one by performance analyses, and achieve the aim of optimizing new generated test suite.

Keywords

optimisation; program testing; AETG pair-wise cover technique; AETG test suite optimization; regressing test model; schema matching; Computer science; Cost function; Educational institutions; Electronic mail; Optimization methods; Petroleum; Software engineering; Software quality; Software testing; System testing; AETG; pair-wise; regression test; schema matching; test suite optimization;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Science and Software Engineering, 2008 International Conference on

Conference_Location

Wuhan, Hubei

Print_ISBN

978-0-7695-3336-0

Type

conf

DOI

10.1109/CSSE.2008.540

Filename

4721999