DocumentCode
48
Title
A Self-Consistent Compact Model of Ballistic Nanowire MOSFET With Rectangular Cross Section
Author
Numata, T. ; Uno, S. ; Hattori, J. ; Mil´nikov, Gennady ; Kamakura, Yoshinari ; Mori, Nobuya ; Nakazato, Kazuo
Author_Institution
Nagoya Univ., Nagoya, Japan
Volume
60
Issue
2
fYear
2013
fDate
Feb. 2013
Firstpage
856
Lastpage
862
Abstract
We propose a compact model of ballistic gate-all-around metal-oxide-semiconductor field-effect transistors. In this model, the potential distribution in the wire cross section is approximated by a quadratic function. This model potential has one unknown parameter, which determines the shape of the potential. The Schrödinger equation in the wire cross section can be approximately solved using the model potential, and the electron energy levels are derived analytically. The unknown parameter is determined by numerically solving a coupled equation for charge densities derived from electrostatics and quantum statistics. We calculate the device properties using the obtained unknown parameter. A Schrödinger-Poisson solver that simulates electron states in the wire cross section is used. The results obtained using it reveal that our model exhibits good agreement for both the lowest and excited energy levels. We estimate the ballistic current using the calculated energy levels and the Landauer formula, which shows good agreement with results simulated using the nonequilibrium Green´s function formalism.
Keywords
Green´s function methods; MOSFET; Schrodinger equation; nanowires; semiconductor device models; Landauer formula; Schrodinger equation; Schrodinger-Poisson solver; ballistic gate-all-around metal oxide semiconductor field-effect transistors; ballistic nanowire MOSFET; charge densities; coupled equation; electron energy levels; electron states; electrostatics; nonequilibrium Green function formalism; potential distribution; quadratic function; quantum statistics; rectangular cross section; self-consistent compact model; wire cross section; Electric potential; Energy states; Equations; Logic gates; Mathematical model; Semiconductor device modeling; Wires; Ballistic transport; compact model; gate-all-around metal–oxide–semiconductor field-effect transistors (GAA-MOSFETs); perturbation theory;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2232928
Filename
6403540
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