• DocumentCode
    480094
  • Title

    Damaged Mechanism Research of RS232 Interface under Electromagnetic Pulse

  • Author

    Gao Jing ; Sun Ji-yin ; Chai Yan-jie ; Wang Bo ; Tao Ling-jiao ; Bao Fei-hu

  • Author_Institution
    Xi´an Res. Inst. of High-tech, Xi´an
  • Volume
    3
  • fYear
    2008
  • fDate
    12-14 Dec. 2008
  • Firstpage
    1119
  • Lastpage
    1122
  • Abstract
    RS232 interface executes the role of Transportation and Communication, which has became the important interface between MCU of embedded system and peripheral equipment. Because RS232 mainly work in bottom of communication protocol, so it is important to protect the infrastructure of RS232. In test, pulse double electromagnetic is pulled into RS232 data transmission lines by coupling clamp, simulated differential-mode pulse voltage, basing on the test data, it will get the damaged mechanism of RS232 interface, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, and getting the performance evaluation of RS232 interface, moreover estimating the voltage pulse range of upper and lower bounds at the port in the normal and damage state.
  • Keywords
    electromagnetic pulse; embedded systems; fault tolerance; peripheral interfaces; protocols; RS232 data transmission lines; RS232 interface; communication protocol; coupling clamp; damaged mechanism research; electromagnetic pulse; embedded system; injected voltage pulse; logistic model; lower bound; performance evaluation; peripheral equipment; port interface; pulse double electromagnetics; simulated differential-mode pulse voltage; transportation and; upper bound; voltage pulse range; Computer peripherals; Data communication; EMP radiation effects; Electromagnetic coupling; Embedded system; Protection; Protocols; Testing; Transportation; Voltage; EMP; Logistic-Regression; RS232-Interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Software Engineering, 2008 International Conference on
  • Conference_Location
    Wuhan, Hubei
  • Print_ISBN
    978-0-7695-3336-0
  • Type

    conf

  • DOI
    10.1109/CSSE.2008.852
  • Filename
    4722537