• DocumentCode
    480558
  • Title

    Dynamic Integrity Measurement Model Based on Trusted Computing

  • Author

    Liu, Changping ; Fan, Mingyu ; Feng, Yong ; Wang, Guangwei

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    1
  • fYear
    2008
  • fDate
    13-17 Dec. 2008
  • Firstpage
    281
  • Lastpage
    284
  • Abstract
    Root trust transfers in turn to BIOS (Basic Input Output System), OS (Operating System) and eventually applications from TPM (Trust Platform Module) in Trusted Computing. Before every transfer of trust, integrity measurement module measures the integrity property of receiver and produces stored measurement log. A dynamic integrity measurement model is proposed to measure integrity during execution of computing platform. This model measures instruction code of operating system and user processes in memory to construct stored measurement log at the time of system call or process scheduler. A prototype is realized under Linux to analyze the validity and performance of this model. Compared with other analogous model, this model can dynamically measure vivid integrity and detect attack during execution of computing platform with little performance cost.
  • Keywords
    Linux; data integrity; input-output programs; invasive software; program diagnostics; scheduling; storage management; Linux; basic input output system; dynamic integrity measurement model; instruction code measurement; operating system; process scheduler; security property; stored measurement log; trust platform module; trusted computing; user process; Application software; Data security; Embedded computing; Linux; Load modeling; Operating systems; Prototypes; Runtime; Semiconductor device measurement; Time measurement; attack detection; dynamic measurement; integrity property; trust computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Security, 2008. CIS '08. International Conference on
  • Conference_Location
    Suzhou
  • Print_ISBN
    978-0-7695-3508-1
  • Type

    conf

  • DOI
    10.1109/CIS.2008.153
  • Filename
    4724658