DocumentCode
480599
Title
A Novel Two-Step Traceback Scheme for DDoS Attacks
Author
Qu, Zhaoyang ; Huang, Chunfeng ; Liu, Ningning
Author_Institution
Sch. of Inf. Eng., Northeast Dianli Univ., Jilin
Volume
1
fYear
2008
fDate
20-22 Dec. 2008
Firstpage
879
Lastpage
883
Abstract
The defense against Distributed Denial of Service (DDoS) attacks is one of the primary concerns on the Internet today. IP spoofing makes it difficult for the victim to determine the packet´s true origin. There is a need for a mechanism that could rapidly trace back to the attacks´ origins for the victim. This paper presents a two-step traceback scheme to track DDoS attack source by dividing the tracing process into two steps. In the first step, packet marking method based on autonomous system (ASPMM) is adopted to determine the attack-originating autonomous system (AS). In the second step, non-repeated probabilistic packet marking (NRPPM) is used to identify the exact origin of the attacks in the specific AS. Compared with previous algorithms, the two-step traceback scheme has the benefits of low bandwidth consumption, quick convergence speed, light computational overhead of address recombination, it can decrease the number of packets the path reconstruction needs, and improve the efficiency of path reconstruction, hence making it possible to trace the DDoS attack source rapidly.
Keywords
IP networks; Internet; probability; security of data; DDoS; IP spoofing; Internet; autonomous system; distributed denial of service attacks; non-repeated probabilistic packet marking; packet marking method; path reconstruction; two-step traceback scheme; Bandwidth; Cities and towns; Computer crime; Convergence; Encoding; Information technology; Mechanical engineering; Power engineering and energy; Routing; Web and internet services; AS; DDoS Attack; IP Traceback; Network Security; Packet Marking;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location
Shanghai
Print_ISBN
978-0-7695-3497-8
Type
conf
DOI
10.1109/IITA.2008.102
Filename
4739697
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