DocumentCode :
481321
Title :
Multiscale model of honed profiles
Author :
Wu, Liqun ; Quan, Taiwei ; Zeng, Wenhan ; Jiang, Xiangqian
Author_Institution :
Hangzhou Dianzi University, 310018, China
fYear :
2006
fDate :
6-7 Nov. 2006
Firstpage :
1339
Lastpage :
1341
Abstract :
Some important profiles such as that made by honing process are skew and complex. In this paper, a new and more flexible elementary function was found to create a advanced multiscale model defined by an infinite series. In this series, each elementary term characterized a skew feature at a given scale. Some honed profiles were measured and tested by a tactile PGI profiler. The results showed that our model was allowed to characterize the skew phenomenon. Then a method was developed to study the smoothing effect caused by the stylus radius with the theory of the fractal peak radius curvature of the skew profiles. And a critical scale was found in this paper.
Keywords :
Skew; honed; model; multiscale; profile;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Technology and Innovation Conference, 2006. ITIC 2006. International
Conference_Location :
Hangzhou
ISSN :
0537-9989
Print_ISBN :
0-86341-696-9
Type :
conf
Filename :
4752213
Link To Document :
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