Title :
Embedded system of temperature testing based on DS18B20
Author :
Shen, Hongyao ; Fu, Jianzhong ; Chen, Zichen
Author_Institution :
Institute of Manufacturing Engineering, Zhejiang University, Hangzhou, 310027, China
Abstract :
The paper introduces a new system of temperature testing. It uses ARM S3C44BOX as its microcontroller, with the 1-Wire digital thermometer DS18B20 as a temperature sensor. This paper introduces the temperature testing principle of DS18B20, the design of hardware and software, and the optimized arithmetic of Search ROM command, which is most important in the software realization.
Keywords :
DS18B20; S3C44BOX; Temperature; route-remember arithmetic;
Conference_Titel :
Technology and Innovation Conference, 2006. ITIC 2006. International
Conference_Location :
Hangzhou
Print_ISBN :
0-86341-696-9
