DocumentCode :
481847
Title :
A blind wavelet-based watermarking with detail-subband coefficients prediction
Author :
Guo, Jing-Ming ; Tzeng, Yu-Quan ; Lee, Jiann-Der
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
1805
Lastpage :
1810
Abstract :
Recently, the wavelet transform is widely used in multimedia signal processing applications. To provide security solution, the digital watermarking is involved. This study presents a blind wavelet-based watermarking which cooperates with the human visual system (HVS) embedding watermarks into detail-subband coefficients. Since the imperceptibility is the most significant issue in watermarking, the approximate band is maintained unchanged, while the other detail subbands are modified to carry information. The perceptual embedded weights for all subbands are determined based on the just noticeable distortion (JND) criterion. The strength of the modification is investigated to provide a compromised result between robustness and image quality. In the decoder, the least-mean-square (LMS) is involved to predict the original detail-subband coefficients and then extract the embedded watermarks. As documented in experimental results, the proposed method provides good robustness and excellent image quality.
Keywords :
decoding; distortion; image coding; least mean squares methods; watermarking; wavelet transforms; blind wavelet-based watermarking; detail-subband coefficient prediction; digital watermarking; human visual system; image decoding; image quality; just noticeable distortion criterion; least-mean-square method; multimedia signal processing application; security solution; wavelet transform; Decoding; Humans; Image quality; Least squares approximation; Robustness; Security; Signal processing; Visual system; Watermarking; Wavelet transforms; digital watermarking; discrete wavelet transform; human visual system; just noticeable distortion; least mean square;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
ISSN :
1553-572X
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2008.4758229
Filename :
4758229
Link To Document :
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