DocumentCode
481851
Title
A novel approach of feature classification using Support Vector Data Description combined with interpolation method
Author
Wang, Chi-Kai ; Ting, Yung ; Liu, Yi-Hung
Author_Institution
Dept. of Mech. Eng., Chung Yuan Christian Univ., Chung-Li
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
1828
Lastpage
1832
Abstract
In this paper, we propose a novel approach to feature classification using support vector data description (SVDD) combined with interpolation method. In SVDD, the width parameter s and the penalty parameter C influence the learning results. The N-fold M times cross-validation method is well-known and popular scheme to calculate the best (C, s ) values. To automatically optimize the identification rate, we need more outliers. Due to this reason, we utilize the interpolation method to generalize new outliers. At the last, we use four benchmark data sets: Iris, Wine, Balance-scale, and Ionosphere four data base to validate the method in this research has better classification output and faster performance.
Keywords
interpolation; pattern classification; support vector machines; cross-validation method; feature classification; interpolation method; support vector data description; Error analysis; Interpolation; Ionosphere; Iris; Kernel; Mechanical engineering; Object detection; Parameter estimation; Support vector machine classification; Support vector machines; N-fold M times cross-validation; Support Vector Data Description (SVDD);
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758233
Filename
4758233
Link To Document