DocumentCode :
481851
Title :
A novel approach of feature classification using Support Vector Data Description combined with interpolation method
Author :
Wang, Chi-Kai ; Ting, Yung ; Liu, Yi-Hung
Author_Institution :
Dept. of Mech. Eng., Chung Yuan Christian Univ., Chung-Li
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
1828
Lastpage :
1832
Abstract :
In this paper, we propose a novel approach to feature classification using support vector data description (SVDD) combined with interpolation method. In SVDD, the width parameter s and the penalty parameter C influence the learning results. The N-fold M times cross-validation method is well-known and popular scheme to calculate the best (C, s ) values. To automatically optimize the identification rate, we need more outliers. Due to this reason, we utilize the interpolation method to generalize new outliers. At the last, we use four benchmark data sets: Iris, Wine, Balance-scale, and Ionosphere four data base to validate the method in this research has better classification output and faster performance.
Keywords :
interpolation; pattern classification; support vector machines; cross-validation method; feature classification; interpolation method; support vector data description; Error analysis; Interpolation; Ionosphere; Iris; Kernel; Mechanical engineering; Object detection; Parameter estimation; Support vector machine classification; Support vector machines; N-fold M times cross-validation; Support Vector Data Description (SVDD);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
ISSN :
1553-572X
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2008.4758233
Filename :
4758233
Link To Document :
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