• DocumentCode
    481851
  • Title

    A novel approach of feature classification using Support Vector Data Description combined with interpolation method

  • Author

    Wang, Chi-Kai ; Ting, Yung ; Liu, Yi-Hung

  • Author_Institution
    Dept. of Mech. Eng., Chung Yuan Christian Univ., Chung-Li
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    1828
  • Lastpage
    1832
  • Abstract
    In this paper, we propose a novel approach to feature classification using support vector data description (SVDD) combined with interpolation method. In SVDD, the width parameter s and the penalty parameter C influence the learning results. The N-fold M times cross-validation method is well-known and popular scheme to calculate the best (C, s ) values. To automatically optimize the identification rate, we need more outliers. Due to this reason, we utilize the interpolation method to generalize new outliers. At the last, we use four benchmark data sets: Iris, Wine, Balance-scale, and Ionosphere four data base to validate the method in this research has better classification output and faster performance.
  • Keywords
    interpolation; pattern classification; support vector machines; cross-validation method; feature classification; interpolation method; support vector data description; Error analysis; Interpolation; Ionosphere; Iris; Kernel; Mechanical engineering; Object detection; Parameter estimation; Support vector machine classification; Support vector machines; N-fold M times cross-validation; Support Vector Data Description (SVDD);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758233
  • Filename
    4758233