DocumentCode
481860
Title
Intelligent technology for predicting water bloom engendering
Author
Liu, Zaiwen ; Wang, Xiaoyi ; Cui, Lifeng ; Lian, Xiaofeng ; Xu, Jiping
Author_Institution
Sch. of Inf. Eng., Beijing Technol. & Bus. Univ., Beijing
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
1896
Lastpage
1900
Abstract
Main factors which make water bloom engendering in river and lakes is analyzed, and the modeling method of short-time predicting for water bloom based on RBF neural network, including supervise learning method for the center, width and weight of base function in RBF neural network, error-correction algorithm based on gradient descent of RBF, is proposed. The effect which hidden layer of RBF brings to network performance is compared, and fitting capacity between RBFpsilas width and generalization capability of network is discussed. According to the results of network training and water bloom forecast, RBF neural network can be used to forecast the change of Chi_a in short term. Because of the strong generalization capability, high forecast precision and good fitting performance, the model has established a solid foundation for further research on short-term forecast methods of water bloom in river and lakes and the simulation result showed that the method is very practice and useful.
Keywords
geophysics computing; hydrological techniques; lakes; neural nets; nitrogen; phosphorus; radial basis function networks; rivers; sediments; water quality; N; P; RBF neural net; chlorophyll-a; dissolved oxygen; error-correction algorithm; eutrophic element; lake; radial basis function; river; water bloom engendering prediction; water bloom forecasting; water color change; water contamination; water eutrophication; water quality; Artificial neural networks; Biological system modeling; Chemical technology; Computer networks; Ecosystems; Lakes; Neural networks; Predictive models; Rivers; Water pollution;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758245
Filename
4758245
Link To Document