Title :
Thermal process robust identification using wavelet de-noise and least-squares method
Author :
Liu, Changliang ; Li, Taoyong ; Cen, Wei ; Jia, Yanchen
Author_Institution :
Sch. of Control Sci. & Eng., North China Electr. Power Univ., Baoding
Abstract :
Unmodeled dynamics exit when modeling with transfer function model set for thermal process. Unmodeled dynamics and stochastic disturbances are considered as colored noise which makes least-squares estimates bias. De-colored noise using wavelet MRA is beneficial to enhance identification accuracy and robust. This is also proved by simulation with a linear time-invariant system. The proposed method processed operation data comes from thermal process and got satisfying result.
Keywords :
least mean squares methods; parameter estimation; signal denoising; wavelet transforms; de-colored noise; least-squares estimates bias; least-squares method; linear time-invariant system; stochastic disturbances; thermal process robust identification; transfer function model set; unmodeled dynamics; wavelet de-noise; Colored noise; Multiresolution analysis; Noise measurement; Noise robustness; Nonlinear dynamical systems; Power engineering and energy; Power system modeling; System identification; Thermal engineering; Transfer functions; Parameter estimation; System identification; Unmodeled dynamics; Wavelet De-noise;
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2008.4758254